With the rapidly increasing RF Complexity of RF BiCMOS designs for key Mobile, Internet Everywhere and Car Radio applications:
- Extreme RF Performance Requirements
- Higher Frequency (<6GHz, 30GHz, 70GHz)
- Lower Power, High Linearity < -100dBc
Achieving both extreme RF performance and ESD reliability requirements (2kV HBM, 500V CDM) has become a big challenge for the IC products. In this context, the use of an ESD Layout Check tool is essential in order to verify the proper layout implementation of the ESD protection strategy with the purpose to have a first time right silicon ESD conform design.
This presentation will focus on the ESD Layout Check tool applied to an RF IC design in an RF BiCMOS technology.
Dolphin Abessolo Bidzo, NXP Semiconductors