Door: Electrometric B.V.
Date : Tues. 19 March 2024
Time : 15:00 CET
PCIe Gen6 Testing Challenges
PCI Express technology is one of the most advanced computer I/O serial standards highly adopted on AI, ML, ADAS, Data Center, Cloud and other applications. It can be used as peripheral device interconnect, chip-to-chip interface and as a bridge to many other protocol standards.
Join Teledyne LeCroy and Anritsu for this fascinating webinar which will focus on technology evolution for PCIe Gen6 and related testing challenges.
Presented by
Martin Storch (Field Application Engineer – Anritsu)
Maurizio Mastrofini (Senior Application Engineer – Teledyne LeCroy)
Can’t attend live? Register anyway and we will send you the recording afterward.
