When testing and measuring is part of your regular routine, you will get sometimes unexpected results. You could start wondering if the signal’s representation on the oscilloscope is correct, or if it’s ‘created’ by your measurement equipment. When looking at today’s high speed rise times of GaN and SiC designs, you may forget that oscilloscope and probe specifications play an essential role in interpreting the result you see. In this presentation, we will look at how your signals are influenced by the probe and the oscilloscope as a system. We will look at how your signal’s representation on an oscilloscope differs from the expected result you got from your simulation software. Ever wondered how the Miller Plateau really looks like? Come and see!
Sven De Coster, C.N. Rood